Atom Probe Microscopy (Springer Series in Materials Science) by Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P.

By Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer

Atom probe microscopy allows the characterization of fabrics constitution and chemistry in 3 dimensions with near-atomic answer. This uniquely robust method has been topic to significant instrumental advances over the past decade with the advance of wide-field-of-view detectors and pulsed-laser-assisted evaporation that experience considerably more advantageous the instrument’s services. the sector is thriving, and atom probe microscopy is being embraced as a mainstream characterization strategy. This publication covers all aspects of atom probe microscopy―including box ion microscopy, box desorption microscopy and a powerful emphasis on atom probe tomography.

Atom Probe Microscopy is geared toward researchers of all event degrees. it's going to give you the newbie with the theoretical historical past and useful info essential to examine how fabrics paintings utilizing atom probe microscopy innovations. This comprises specific reasons of the basics and the instrumentation, modern specimen education innovations, experimental info, and an outline of the consequences that may be acquired. The e-book emphasizes approaches for assessing information caliber, and the right kind implementation of complicated facts mining algorithms. these more matured within the strategy will enjoy the publication as a unmarried entire resource of vital reference details, tables and strategies. either newbie and professional will worth the best way that Atom Probe Microscopy is determined out within the context of fabrics technological know-how and engineering, and contains references to key contemporary study results.

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W. Smith, Atom Probe Microanalysis: Principles and Applications to Materials Problems (Materials Research Society, Pittsburg, PA, 1989) 6. W. T. Tsong, Field Ion Microscopy, Principles and Applications (Elsevier, New York, NY, 1969) 7. T. Tsong, Atom-Probe Field Ion Microscopy: Field Emission, Surfaces and Interfaces at Atomic Resolution (Cambridge University Press, New York, NY, 1990) 8. R. Wagner, Field-Ion Microscopy (Springer-Verlag, Berlin Heidelberg, 1982) 9. R. Gomer, Field Emission and Field Ionisation (Havard University, Cambridge, 1961) 28 2 Field Ion Microscopy 10.

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5, the distribution of Mg2+ in a 6000 series Al alloy has been plotted, showing several needle-shaped b" precipitates. These precipitates contain Mg and Si and have a higher evaporation field than the Al matrix, the atoms from which are predominantly detected in the 1+ charge-state. Variations in local curvature of the tip and the resulting increase in electric field are clearly revealed by the distribution of the Al2+ ions, which occur in close correlation with the position of the high-evaporation-field precipitates (Fig.

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